Technical information
Essential technical details of the NanoSIMS machine:
| Model | NanoSIMS 50L by CAMECA |
| Primary Ion Sources | Cs⁺ (Cesium) source and RF plasma O⁻ (Oxygen) source |
| Mass Resolution (M/ΔM) | > 10,000 (sufficient to resolve isobaric interferences) |
| Lateral Resolution | ~50 nm (depending on conditions and element), typically around 120 nm |
| Depth Resolution | < 10 nm |
| Simultaneous Detectors | Up to 7 electron multipliers (EMs) for parallel detection of isotopes/elements |
| Analyzable Elements | Most elements ranging from H to U depending on their ionization |
| Sample Types | Thin sections, polished surfaces, biological tissues, particles, etc. |
| Vacuum Requirements | Ultra-high vacuum (UHV) in analysis chamber |
| Measurement modes | Point scans, line scans, 2D raster imaging mode |
| Features | High sensitivity, high spatial resolution, multi-isotope detection |
Equipment
Besides the NanoSIMS 50L, our NanoSIMS lab is equipped with some additional instruments for sample preparation and control:
- Reflected light microscope - ZEISS Axio Imager Z2, for control of accurate sample preparation, creating maps for further SEM and NanoSIMS analyses
- Sputter coater - for coating of insulating samples with Au/Pd alloy
- Low speed saw - Allied Techcut 4, sectioning of embedded samples before final polishing
- Laminar flow box - sample mounting possible under dust free conditions
For sample mounting we can provide sample holders fitting samples ranging from filters of 5 mm diameter to up to single samples with a diameter of 2.5 cm. Beside the specific instruments for the work related to NanoSIMS, our lab runs several other analytical instruments as listed on our main homepage.
Manufacturer:
Cameca, Gennevilliers Cedex, France:
http://www.cameca.com
NanoSIMS:
http://www.cameca.com/instruments-for-research/nanosims.aspx